Variable gap hard stop design

ABSTRACT

A reaction system for processing semiconductor substrates is disclosed. The reaction system includes a susceptor for holding the substrate as well as a baseplate as a part of housing for the reaction system. A pin located on the susceptor can interact with a baseplate feature located on the baseplate to result in a variable gap between the susceptor and the baseplate. The baseplate feature may take the form of a series of steps, a wedge, or a milled-out feature.

FIELD OF INVENTION

The present disclosure generally relates to semiconductor processing tools. More particularly, the disclosure relates to a wafer handling mechanism comprising a susceptor and a baseplate of a reaction region.

BACKGROUND OF THE DISCLOSURE

Semiconductor processing typically involves fabrication of devices, such as transistors, diodes, and integrated circuits, upon a thin piece of semiconductor material called a substrate. The semiconductor processing takes place in a reaction region, where gases are passed over the substrate, resulting in a controlled deposit of material upon the substrate. The substrate is lifted into the reaction region by a susceptor.

FIG. 1 illustrates such a prior art reaction system 100. The reaction system 100 includes a reaction region 105 and a substrate loading region 110. The reaction region 105 is defined by a reaction region housing 115 and a reactant distribution system 120. The reactant distribution system 120 is illustrated as a showerhead gas flow system, but could be a cross-flow designed system. Separating the reaction region 105 and the substrate loading region 110 is a baseplate 125. A substrate chamber housing 130 defines the substrate loading region 110.

In FIG. 1, the reaction system 100 is in a substrate loading mode, as a substrate 135 is loaded on top of a susceptor 140. The susceptor 140 is moved up and down by a movement element 145. The movement element 145 may also allow rotation of the susceptor 140 and the substrate 135. Also, a substrate loading mechanism 150 is configured to load and unload the substrate 135 onto the susceptor 140.

Disposed at various points along the susceptor 140 are a set of pads 155. The pads 155 are disposed between the susceptor 140 and the baseplate 125. The pads prevent direct physical contact between the susceptor 140 and the baseplate 125.

FIG. 2 illustrates the reaction system 100 in a substrate processing mode. The substrate 135 is moved into the reaction region 105 by the susceptor 140 and the movement element 145. When the reaction system 100 is in the substrate processing mode, the pad 155 in the susceptor 140 will contact the baseplate 125.

FIG. 3 shows a zoomed view of the contact between the pad 155 and the baseplate 125. A gap 160 is formed between the susceptor 140 and the baseplate 125 during processing of substrate 135. The purpose of the gap 160 is to allow fluid communication between the inside of the reaction region and outside the susceptor. A height 165 of the pads 155 can range between 0.001 inches (approximately 25 μm) and about 0.05 inches (approximately 1275 μm). When the pad 155 contacts the baseplate 125, the gap 160 will be the height of the pad 155 that is above a susceptor surface 140A.

Over time, continued processing in the reaction region 105 can result in a deposition of reactive materials on and around the pads 155 of the susceptor 140. This deposition build-up can lead to the reduction in size of the gap 160. As a result, the build-up may change the flow dynamics inside and outside the reaction region 105. This can cause issues of contamination and defects in the processed substrate 135.

In addition, continued contact between the pads 155 and the baseplate 125 may result in an erosion of the pads 155. As shown in FIG. 3A, a result of the continued contact is a reduction in a height 165′ of the pads 155 as well as a reduction in a gap 160′. The flow dynamics inside and outside the reaction region 105 will be affected.

One course of action exists to deal with the deposition build-up. The reaction region may be opened and the pads may be replaced. In addition, the reaction region itself may be replaced. However, with these steps, the reaction region may be disassembled. The disassembly would take place after a particular number of cycles or substrates processed. This number was determined through the use of historical data that monitored how the deposition build-up of materials occurred. The disassembly is generally not feasible as it leads to processing downtime.

As a result, it is desired to have an arrangement for the reaction region to address the issue of a shrinking gap due to build-up without the disassembly of the reaction region.

SUMMARY OF THE DISCLOSURE

According to at least one embodiment of the invention, a reaction system is disclosed. The reaction system includes a susceptor, a pin located on the susceptor, a baseplate for interacting with the susceptor, a movement element for moving the susceptor, and a baseplate feature on the baseplate. Interaction between the susceptor and the baseplate results in a variable gap between the susceptor and the baseplate. The variable gap is adjustable based on the location of the pin's contact of the baseplate feature. The baseplate feature may take at least one of the following forms: a series of steps, a wedge, or a milled-out feature.

According to at least one embodiment of the invention, a baseplate assembly is disclosed. The baseplate assembly includes a baseplate and a baseplate feature located on the baseplate. The baseplate and the baseplate feature are configured to interact with a pin located on a susceptor that holds a substrate, such that a location of contact between the pin and the baseplate feature or the baseplate will result in a variable gap between the baseplate and the susceptor. The baseplate feature may take at least one of the following forms: a series of steps, a wedge, or a milled-out feature.

For purposes of summarizing the invention and the advantages achieved over the prior art, certain objects and advantages of the invention have been described herein above. Of course, it is to be understood that not necessarily all such objects or advantages may be achieved in accordance with any particular embodiment of the invention. Thus, for example, those skilled in the art will recognize that the invention may be embodied or carried out in a manner that achieves or optimizes one advantage or group of advantages as taught or suggested herein without necessarily achieving other objects or advantages as may be taught or suggested herein.

All of these embodiments are intended to be within the scope of the invention herein disclosed. These and other embodiments will become readily apparent to those skilled in the art from the following detailed description of certain embodiments having reference to the attached figures, the invention not being limited to any particular embodiment(s) disclosed.

BRIEF DESCRIPTION OF THE DRAWING FIGURES

These and other features, aspects, and advantages of the invention disclosed herein are described below with reference to the drawings of certain embodiments, which are intended to illustrate and not to limit the invention.

FIG. 1 is a cross-sectional view of a prior art reaction system in a substrate loading mode.

FIG. 2 is a cross-sectional view of a prior art reaction system in a substrate processing mode.

FIG. 3 is a zoomed view of a prior art reaction system including a pad, a susceptor, and a baseplate as shown in FIG. 2.

FIG. 3A is a zoomed view of a prior art reaction system including a pad, a susceptor, and a baseplate.

FIG. 4 is a cross-sectional view of a reaction system in a substrate loading mode according to one embodiment of the invention.

FIG. 5 is a top elevation view of a susceptor according to one embodiment of the invention.

FIG. 6 is an elevation view of a baseplate according to one embodiment of the invention.

FIG. 7 is an elevation view of a susceptor and a baseplate according to one embodiment of the invention.

FIG. 8 is a cross-sectional view of a reactor system in a substrate processing mode according to one embodiment of the invention.

FIG. 9 is a zoomed view of a reaction system including a pad, a susceptor, and a baseplate according to one embodiment of the invention as shown in FIG. 8.

FIGS. 10A-10D are zoomed cross-sectional views of a reaction system including a pad, a susceptor, and a baseplate according to one embodiment of the invention as shown in FIG. 8.

FIG. 11 is a cross-sectional view of a reaction system in a substrate loading mode according to one embodiment of the invention.

FIG. 12 is an elevation view of a baseplate according to one embodiment of the invention.

FIG. 13 is a zoomed view of a reaction system including a pad, a susceptor, and a baseplate according to one embodiment of the invention as shown in FIG. 11.

FIGS. 14A-14B are side perspective views of a reaction system including a pad, a susceptor, and a baseplate according to one embodiment of the invention as shown in FIG. 11.

FIG. 15 is a zoomed view of a reaction system according to one embodiment of the invention.

FIGS. 16A-16B are side perspective views of a reaction system as shown in FIG. 15.

It will be appreciated that elements in the figures are illustrated for simplicity and clarity and have not necessarily been drawn to scale. For example, the dimensions of some of the elements in the figures may be exaggerated relative to other elements to help improve understanding of illustrated embodiments of the present disclosure.

DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS

Although certain embodiments and examples are disclosed below, it will be understood by those in the art that the invention extends beyond the specifically disclosed embodiments and/or uses of the invention and obvious modifications and equivalents thereof. Thus, it is intended that the scope of the invention disclosed should not be limited by the particular disclosed embodiments described below.

FIG. 4 illustrates a reaction system 200 according to at least one embodiment of the invention. The reaction system 200 includes a reaction region 205 and a substrate loading region 210. The reaction region 205 is defined in part by a reaction region housing 215, a reactant distribution system 220, and a baseplate 225. The substrate loading region 210 is defined in part by a substrate loading housing 230. The reactant distribution system 220 is responsible for passing a gaseous reactant over a substrate to allow for deposition of the reactant material. As illustrated, the reactant distribution system 220 is a showerhead system. However, one of ordinary skill in the art would understand that a cross-flow system may be substituted for the showerhead system for the reactant distribution system 220.

The reaction system 200 also includes a susceptor 235 for holding a substrate 240. The susceptor 235 has a lower surface 235A. A movement element 245 moves both the susceptor 235 and the substrate 240 into the reaction region 205. Also, the movement element 245 is configured to rotate the susceptor 235 and the substrate 240. Furthermore, a substrate loading mechanism 250 is disposed within the susceptor in order to load and unload the substrate 240 from the susceptor 235.

Located on a lower surface 225A of the baseplate 225 are a set of baseplate features 255. According to this embodiment of the invention, the baseplate feature 255 is illustrated as having a series of steps. The steps can range between 0.001 and 0.05 inches in height. More preferably, the steps can range between 0.004 and 0.012 inches in height. The baseplate feature 255 will be in contact with a pin 260 embedded within the susceptor 235.

FIG. 5 illustrates the susceptor 235 and the substrate 240 according to at least one embodiment of the invention. The susceptor 235 is configured to hold the substrate 240. In addition, the pin 260 is installed into the lower surface 235A of the susceptor 235. While it is illustrated that there are three pins installed in the susceptor 235, one of ordinary skill in the art would recognize that any number of pins may be used. An exemplary pin is disclosed in U.S. Pat. No. 8,216,380 to White et al, entitled GAP MAINTENANCE FOR OPENING TO PROCESS CHAMBER, the contents of which are hereby incorporated by reference to the extent such content does not conflict with the present disclosure. The pin 260 may have a height between 0.001 inches (approximately 25 μm) and about 0.05 inches (approximately 1275 μm). The pin 260 may also comprise Celazole® (PolyBenzImidazole) pads, although other materials are also possible.

FIG. 6 illustrates a side of the baseplate 225 that is in contact with the pin 260 located on the susceptor 235 according to at least one embodiment of the invention. Disposed on the lower surface 225A of the baseplate 225 are the plurality of baseplate features 255. The baseplate features 255 are illustrated as having a first step 255A, a second step 225B, and a third step 255C. One of ordinary skill in the art would recognize that the number and the orientation of baseplate features 255 can be modified and arranged depending upon the number of pins 260.

FIG. 7 illustrates the overlay between the baseplate 225 and the susceptor 235 (shown as dotted lines) when the reaction system 200 is in a substrate processing mode according to at least one embodiment of the invention. The overlay is such that the pins 260 located on the susceptor 235 are in contact with one of the first step 255A, the second step 255B, or the third step 255C of the baseplate features 255 or the lower surface 225A of the baseplate 225. It is envisioned that the contact between the pins 260 and the baseplate features 255 take place at the same step level of the baseplate feature 255. This would allow for a consistent size of the gap between the susceptor 235 and the baseplate 225. The susceptor 235 is configured to rotate along a direction A around an axis X such that the pins 260 can contact the baseplate 225 at different locations on the baseplate features 255. The process of adjusting the size of the gap between the susceptor 235 and the baseplate 225 by adjusting the position of the pins is known as indexing.

The reaction system 200 is shown in a substrate processing mode in FIG. 8 according to at least one embodiment of the invention. In this mode, the movement element 245 has elevated the susceptor 235 and substrate 240 into the reaction region 205. As a result, the pin 260 on the susceptor 235 is in contact with the baseplate 225.

The contact of the pin 260 onto the baseplate 225 is shown in greater detail in FIG. 9. The baseplate feature 255 is shown extending from a bottom surface of the baseplate 225. The baseplate feature 255 has a plurality of surfaces that contact the pin 260. These surfaces are shown in detail in FIGS. 10A-10D.

In FIG. 10A, the pin 260 contacts a lower surface 225A on the baseplate 225. The contact between the pin 260 and the baseplate feature surface 255A forms a gap 270A. At this height of the gap 270A, the reaction system 200 may process a predetermined number of substrates 240. For example, the reaction system 200 may process five thousand substrates with the pin 260 in contact with the lower surface 225A. During this time, materials from the deposition reaction may enter and buildup within the gap 270A, reducing its size and potentially leading to contamination and defects in the substrate 240. As a result, the reaction system 200 may adjust for the shrinking gap.

In an indexing process, the movement element 245 is capable of lowering the susceptor 235 in a direction C and shifting it to the right in a direction B as shown in FIG. 10B. The movement element 245 may then put the pin 260 in contact with a first step 255A of the baseplate feature 255. The result of this contact is the formation of a gap 270B. The gap 270B would be greater in size than the gap 270A.

At this height of the gap 270B, the reaction system 200 may process a predetermined number of substrates 240. For example, the reaction system 200 may process five thousand substrates with the pin 260 in contact with the first step 255A. During this time, materials from the deposition reaction again may enter into the gap 270B, reducing its size and potentially leading to contamination and defects in the substrate 240.

As shown in FIG. 10C, the indexing process continues and the movement element 245 is capable of lowering the susceptor 235 in a direction C, shifting it to the right in a direction B, and then putting the pin 260 in contact with a second step 255B. The result of this contact is the formation of a gap 270C. The gap 270C would be greater in size than the gap 270B or the gap 270A.

At this height of the gap 270C, the reaction system 200 may process a predetermined number of substrates 240. For example, the reaction system 200 may process five thousand substrates with the pin 260 in contact with the second step face 255B. During this time, materials from the deposition reaction again may enter into the gap 270C, reducing its size and potentially leading to contamination and defects in the substrate 240.

As shown in FIG. 10D, in another step of the indexing process, the movement element 245 is capable of lowering the susceptor 235 in a direction C, shifting it to the right in a direction B, and then putting the pin 260 in contact with a third step 255C. The result of this contact is the formation of a gap 270D. The gap 270D would be greater in size than the gap 270C, the gap 270B, or the gap 270A.

At this height of the gap 270D, the reaction system 200 may process a predetermined number of substrates 240. For example, the reaction system 200 may process five thousand substrates with the pin 260 in contact with the baseplate feature surface 255D. During this time, materials from the deposition reaction again may enter into the gap 270D, reducing its size and potentially leading to contamination and defects in the substrate 240.

FIG. 11 illustrates a reaction system 300 according to at least one embodiment of the invention. The reaction system 300 includes a reaction region 305 and a substrate loading region 310. The reaction region 305 is defined in part by a reaction region housing 315, a reactant distribution system 320, and a baseplate 325. The substrate loading region 310 is defined in part by a substrate loading housing 330. The reactant distribution system 320 is responsible for passing a gaseous reactant over a substrate to allow for deposition of the reactant material. As illustrated, the reactant distribution system 320 is a showerhead system. However, one of ordinary skill in the art would understand that a cross-flow system may be substituted for the showerhead system for the reactant distribution system 320.

The reaction system 300 also includes a susceptor 335 for holding a substrate 340. The susceptor 335 has a lower surface 335A. A movement element 345 moves both the susceptor 335 and the substrate 340 into the reaction region 305. Also, the movement element 345 is configured to rotate the susceptor 335 and the substrate 340. Furthermore, a substrate loading mechanism 350 is disposed within the susceptor in order to load and unload the substrate 340 from the susceptor 335.

Located on a lower surface 325A of the baseplate 325 are a set of baseplate features 355. The baseplate feature 355 is illustrated as a series of wedges. The wedges can range between 0.001 and 0.05 inches in height. Furthermore, it may be preferred that the wedges be between 0.004 and 0.012 inches in height. The baseplate feature 355 will be in contact with a pin 360 embedded within the lower surface 335A of the susceptor 335.

FIG. 12 illustrates a side of the baseplate 325 that is in contact with the pin 360 located on the susceptor 335 according to at least one embodiment of the invention. Disposed on the lower surface 325A of the baseplate 325 are the plurality of baseplate features 355. The baseplate features 355 are arranged to allow for a consistent gap between the baseplate 325 and the susceptor 335. One of ordinary skill in the art would recognize that the number of baseplate features 355 can be modified and arranged depending upon the number of pins 360.

The reaction system 300 is shown in a substrate processing mode in FIG. 13 according to at least one embodiment of the invention. In this mode, the movement element 345 has elevated the susceptor 335, such that the pin 360 on the susceptor 335 is in contact with the lower surface 325A of the baseplate 325. The baseplate feature 355 has a front edge 355A and a back edge 355B.

In FIG. 14A, an indexing process according to at least one embodiment of the invention is illustrated. The pin 360 contacts a baseplate surface 325A on the baseplate 325. The contact between the pin 360 and the baseplate surface 325A forms a gap 370A. At this height of the gap 370A, the reaction system 300 may process a predetermined number of substrates 340. For example, the reaction system 300 may process five thousand substrates with the pin 360 in contact with the baseplate surface 325A. During this time, materials from the deposition reaction may enter and buildup within the gap 370A, reducing its size and potentially leading to contamination and defects in the substrate 340. As a result, the reaction system 300 may have to adjust for the shrinking gap.

The movement element 345 is capable of lowering the susceptor 335 in a direction C and shifting it to the right in a direction B. The movement element 345 may then put the pin 360 in contact with a front edge 355A of the baseplate feature 355 as shown in FIG. 14B.

The result of this contact is the formation of a gap 370B. The gap 370B would be greater in size than the gap 370A.

At this height of the gap 370B, the reaction system 300 may process a predetermined number of substrates 340. For example, the reaction system 300 may process five thousand substrates with the pin 360 in contact with the front edge 355A. During this time, materials from the deposition reaction again may enter into the gap 370B, reducing its size and potentially leading to contamination and defects in the substrate 340. At least one embodiment of this invention is able to allow the pin 360 to be lowered and shifted such that the pin 360 would be in contact with the back edge 355B of the baseplate feature 355. This arrangement would potentially avoid the need for an unnecessary shutdown of the reaction system.

FIG. 15 illustrates a reaction system according to at least one embodiment of the invention. The reaction system includes a reaction region 405 and a substrate loading region 410. The reaction region 405 is defined by a reaction region housing 415 and a baseplate 425. The substrate loading region is defined by a substrate region housing 430.

A susceptor 435 holds a substrate 440 and raises it into the reaction region 405. The susceptor 435 is moved by a movement element 445. Within a lower surface 435A of the susceptor 435, a pin 460 is installed. The pin 460 interacts with the baseplate 425, which has a lower surface 425A. Within the lower surface 425A, a series of baseplate features 455 is milled or carved out of the baseplate 425. The baseplate features 455 have a top surface 455B and a sloped surface 455C.

FIG. 16A illustrates the interaction between the pin 460 and the baseplate features 455 according to an indexing process in accordance with at least one embodiment of the invention. The pin 460 is touching the top surface 455B of the baseplate feature 455, which also has a vertical surface 455A. The vertical surface 455A can range between 0.001 and 0.05 inches in height. Furthermore, it may be preferred that the vertical surface 455A be between 0.004 and 0.012 inches in height.

When the pin 460 touches the top surface 455B, the lower surface 425A of the baseplate 425 is touching or almost touching the lower surface 435A of the susceptor 435. This results in a little or no gap 470A between the baseplate 425 and the susceptor 435. A benefit that results from this very small gap 470A is a way to determine the alignment between the baseplate 425 and the susceptor 435. In addition, the small gap 470A would also serve as determining whether either the baseplate 425 or the susceptor 435 or both are flat without suffering from any warping effects.

The arrangement shown in FIG. 16A would result in a very low leakage rate of gaseous pressure from the reaction region 405 into the substrate loading region 410. As a result, should there be a high leakage rate when the pin 460 is touching the top surface 455B, this will serve as an alert to an operator of the reaction system of a potential system error in the parts of the system.

After processing a number of substrates with the reaction system in the arrangement shown in FIG. 16A, the susceptor 435 may be moved such that the pin 460 touches another portion of the baseplate feature 455. This movement is shown in FIG. 16B, as the susceptor 435, through the assistance of the movement element 445, moves in a direction B. The movement causes the pin 460 to be incident on the sloped surface 455C of the baseplate feature 455. As a result, a gap 470B increases in size between the baseplate 425 and the susceptor 435. The leakage rate due to gaseous pressure from the reaction region 405 into the substrate loading region 410 should be greater due to the increased gap size. Additional substrates may be processed in this position, with additional movement along the direction B potentially resulting in the pin 460 being incident on the lower surface 425A of the baseplate 425.

The particular implementations shown and described are illustrative of the invention and its best mode and are not intended to otherwise limit the scope of the aspects and implementations in any way. Indeed, for the sake of brevity, conventional manufacturing, connection, preparation, and other functional aspects of the system may not be described in detail. Furthermore, the connecting lines shown in the various figures are intended to represent exemplary functional relationships and/or physical couplings between the various elements. Many alternative or additional functional relationship or physical connections may be present in the practical system, and/or may be absent in some embodiments.

It is to be understood that the configurations and/or approaches described herein are exemplary in nature, and that these specific embodiments or examples are not to be considered in a limiting sense, because numerous variations are possible. The specific routines or methods described herein may represent one or more of any number of processing strategies. Thus, the various acts illustrated may be performed in the sequence illustrated, in other sequences, or omitted in some cases.

The subject matter of the present disclosure includes all novel and nonobvious combinations and subcombinations of the various processes, systems, and configurations, and other features, functions, acts, and/or properties disclosed herein, as well as any and all equivalents thereof. 

We claim:
 1. A reaction system comprising: a susceptor configured to hold a substrate for processing; a pin embedded within the susceptor; a baseplate of a reaction region, the baseplate interacting with the susceptor at a periphery of the susceptor; a movement element configured to rotate the susceptor and the substrate; and a baseplate feature located on the baseplate; wherein a gap is formed between the susceptor and the baseplate when the pin contacts the baseplate feature; wherein a size of the gap can be adjusted based upon a location of the pin's contact on the baseplate feature; and wherein the baseplate feature comprises a series of steps.
 2. The reaction system of claim 1, wherein the series of steps have a height ranging between 0.001 and 0.05 inches.
 3. The reaction system of claim 2, wherein the series of steps have a height ranging between 0.004 and 0.012 inches.
 4. A reaction system comprising: a susceptor configured to hold a substrate for processing; a pin embedded within the susceptor; a baseplate of a reaction region, the baseplate interacting with the susceptor at a periphery of the susceptor; a movement element configured to rotate the susceptor and the substrate; and a baseplate feature located on the baseplate; wherein a gap is formed between the susceptor and the baseplate when the pin contacts the baseplate feature; wherein a size of the gap can be adjusted based upon a location of the pin's contact on the baseplate feature; and wherein the baseplate feature comprises a wedge.
 5. The reaction system of claim 4, wherein the wedge has a height ranging between 0.001 and 0.05 inches.
 6. The reaction system of claim 5, wherein the baseplate feature comprises a series of steps that have a height ranging between 0.004 and 0.012 inches.
 7. The reaction system of claim 4, wherein the baseplate feature comprises a top surface and a sloped surface.
 8. A reaction system comprising: a susceptor configured to hold a substrate for processing; a pin embedded within the susceptor; a baseplate of a reaction region, the baseplate interacting with the susceptor at a periphery of the susceptor; a movement element configured to rotate the susceptor and the substrate; and a baseplate feature located on the baseplate; wherein a gap is formed between the susceptor and the baseplate when the pin contacts the baseplate feature; wherein a size of the gap can be adjusted based upon a location of the pin's contact on the baseplate feature; and wherein the baseplate feature is created by milling out of a portion from the baseplate, resulting in the baseplate feature comprising a vertical surface, a horizontal surface, and a sloped surface.
 9. The reaction system of claim 8, wherein the vertical surface of the baseplate feature has a height ranging between 0.001 and 0.05 inches.
 10. The reaction system of claim 9, wherein the vertical surface of the baseplate feature has a height ranging between 0.004 and 0.012 inches.
 11. The reaction system of claim 8, wherein a contact between the pin and the horizontal surface of the baseplate feature results in minimization of the gap between the baseplate and the susceptor.
 12. A baseplate assembly comprising: a baseplate configured to define an area in which a reaction takes place; and a baseplate feature disposed on the baseplate; wherein the baseplate feature is configured to interact with a pin located on a susceptor holding a substrate; wherein a contact of the pin onto the baseplate feature creates a gap between the baseplate and the susceptor, a size of the gap being dependent on a location of the contact relative to the baseplate feature; and wherein the baseplate feature comprises a step.
 13. The baseplate assembly of claim 12, wherein the step has a height ranging between 0.004 and 0.012 inches.
 14. A baseplate assembly comprising: a baseplate configured to define an area in which a reaction takes place; and a baseplate feature disposed on the baseplate; wherein the baseplate feature is configured to interact with a pin located on a susceptor holding a substrate; wherein a contact of the pin onto the baseplate feature creates a gap between the baseplate and the susceptor, a size of the gap being dependent on a location of the contact relative to the baseplate feature; and wherein the baseplate feature comprises a wedge.
 15. The baseplate assembly of claim 14, wherein the baseplate feature comprises a series of wedges.
 16. The baseplate assembly of claim 14, wherein the wedge has a height ranging between 0.004 and 0.012 inches.
 17. A baseplate assembly comprising: a baseplate configured to define an area in which a reaction takes place; and a baseplate feature disposed on the baseplate; wherein the baseplate feature is configured to interact with a pin located on a susceptor holding a substrate; wherein a contact of the pin onto the baseplate feature creates a gap between the baseplate and the susceptor, a size of the gap being dependent on a location of the contact relative to the baseplate feature; and wherein the baseplate feature is created by milling out of a portion from the baseplate, resulting in the baseplate feature comprising a vertical surface, a horizontal surface, and a sloped surface.
 18. The baseplate assembly of claim 17, wherein the vertical surface of the baseplate feature has a height ranging between 0.004 and 0.012 inches.
 19. The baseplate assembly of claim 17, wherein a contact between the pin and the horizontal surface of the baseplate feature results in minimization of the gap between the baseplate and the susceptor.
 20. The baseplate assembly of claim 19, wherein the minimization of the gap between the baseplate and the susceptor provides an indication of a warping status of the baseplate assembly or the susceptor. 